Invention Grant
- Patent Title: Device and method for detecting defect contour with omnidirectionally equal sensitivity based on magnetic excitation
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Application No.: US16904075Application Date: 2020-06-17
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Publication No.: US11150311B2Publication Date: 2021-10-19
- Inventor: Songling Huang , Wenzhi Wang , Lisha Peng , Wei Zhao , Shen Wang , Zijing Huang
- Applicant: Tsinghua University
- Applicant Address: CN Beijing
- Assignee: Tsinghua University
- Current Assignee: Tsinghua University
- Current Assignee Address: CN Beijing
- Agency: Hodgson Russ LLP
- Priority: CN201911280680.6 20191213
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01R33/038 ; H01F7/02
Abstract:
A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
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