公开(公告)号：US10605790B2

公开(公告)日：2020-03-31

申请号：US15665535

申请日：2017-08-01

Applicant: Tsinghua University

Inventor： Songling Huang ,  Wei Zhao ,  Yu Zhang ,  Qing Wang ,  Shen Wang

IPC: G01N29/44 ,  G01N29/24 ,  G01N29/07 ,  G01N29/12 ,  F03D17/00 ,  F03D80/50 ,  G01N29/04 ,  G01N29/22 ,  G01N29/26 ,  G01N29/34

Abstract: The present disclosure provides a device and method for detecting a defect in a main shaft of a wind turbine. The device includes: an excitation source, configured to generate an electromagnetic ultrasonic guided wave signal; a nickel strap, magnetized and disposed on an outer surface of an end of the main shaft; a coil, disposed at the nickel strap, configured to receive the electromagnetic ultrasonic guided wave signal such that the electromagnetic ultrasonic guided wave signal propagates in the main shaft, the coil and the nickel strap being configured to transform the electromagnetic ultrasonic guided wave signal propagating in the main shaft into an electrical signal by electromagnetic induction; a signal collector, configured to collect the electrical signal and transform the electrical signal into guided wave detection data and a wireless communication component, configured to transmit the guided wave detection data to a remote equipment.

公开(公告)号：US10338035B2

公开(公告)日：2019-07-02

申请号：US15831894

申请日：2017-12-05

Applicant: Nanchang Hangkong University ,  Tsinghua University

Inventor： Songling Huang ,  Kai Song ,  Wei Zhao ,  Chao Lu ,  Yu Zhang ,  Shen Wang ,  Jiarui Dong ,  Zhe Wang

IPC: G01N29/44 ,  G01N29/06 ,  G01N29/04 ,  G01N29/07 ,  G01N29/11 ,  G01N29/24

Abstract: An imaging method based on guided wave scattering of omni-directional EMATs includes: selecting an nth omni-directional EMAT from N omni-directional EMATs uniformly arranged in a detection region of a metal plate to be detected as an excitation EMAT; selecting m omni-directional EMATs as omni-directionally receiving EMATs to omni-directionally receive an ultrasonic guided wave signal, and calculating a travel time and intensity of the ultrasonic guided wave signal; judging whether the excitation EMAT and the omni-directionally receiving EMATs form a scattering group, if yes, calculating a position of a scattering point; judging whether the position of the scattering point is within a preset scattering region, if yes, determining the position of the scattering point as an effective scattering point; repeating the above steps until all N omni-directional EMATs have excited omni-directional ultrasonic guided waves, and performing curve fitting on all effective scattering points to obtain a defect profile image.

公开(公告)号：US10297417B2

公开(公告)日：2019-05-21

申请号：US15615310

申请日：2017-06-06

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Peng Liu ,  Wei Zhao ,  Xiao-Yang Lin ,  Duan-Liang Zhou ,  Chun-Hai Zhang ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: H01J37/26 ,  H01J37/16 ,  H01J37/244

Abstract: The disclosure relates to a method for characterizing a two-dimensional nanomaterial sample. The two-dimensional nanomaterial sample is placed in a vacuum chamber. An electron beam passes through the two-dimensional nanomaterial sample to form a diffraction electron beam and a transmission electron beam to form an image on an imaging device. An angle θ between the diffraction electron beam and the transmission electron is obtained. A lattice period d of the two-dimensional nanomaterial sample is calculated according to a formula d sin θ≅dθ=λ, where λ represents a wavelength of the electron beam.

公开(公告)号：US10197534B2

公开(公告)日：2019-02-05

申请号：US14948398

申请日：2015-11-23

Applicant: Tsinghua University

Inventor： Songling Huang ,  Shen Wang ,  Wei Zhao ,  Shisong Li ,  Zheng Wei

IPC: G01N29/06 ,  G01N29/07 ,  G01N29/24

Abstract: Disclosed are a method and a device for testing a defect based on an ultrasonic Lamb wave tomography. The method includes: partitioning an imaging area of a material to be tested into grids; exciting electromagnetic acoustic transducers for emitting to emit Lamb waves with a A0 mode in all directions, and electromagnetic acoustic transducers for receiving to receive the Lamb waves; obtaining a time-frequency analysis result and recording time-of-flights of testing waves; determining a first slowness of each grid to obtain a first defect area; establishing an extrapolation formula according to the first defect area, and iterating the extrapolation formula to trace and revise paths of the Lamb waves until a better imaging precision is obtained.

公开(公告)号：US09991094B2

公开(公告)日：2018-06-05

申请号：US15615289

申请日：2017-06-06

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Peng Liu ,  Wei Zhao ,  Xiao-Yang Lin ,  Duan-Liang Zhou ,  Chun-Hai Zhang ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: H01J37/00 ,  H01J37/295 ,  H01J37/18 ,  H01J37/20 ,  H01J37/22

CPC classification number: H01J37/295 ,  G01N23/20058 ,  H01J37/18 ,  H01J37/20 ,  H01J37/222 ,  H01J37/265 ,  H01J2237/0245 ,  H01J2237/063 ,  H01J2237/182 ,  H01J2237/1825 ,  H01J2237/20 ,  H01J2237/20228 ,  H01J2237/2447

Abstract: The disclosure relates to a low energy electron microscopy. The electron microscopy includes a vacuum chamber; an electron gun used to emit electron beam; a diffraction chamber; an imaging device; a sample holder used to fix two-dimensional nanomaterial sample; a vacuum pumping device; and a control computer. The electron beam transmits the sample to form a transmission electron beam and diffraction electron beam. The control computer includes a switching module to switch the work mode between a large beam spot diffraction imaging mode and small beam spot diffraction imaging mode.

公开(公告)号：US10935520B2

公开(公告)日：2021-03-02

申请号：US15910433

申请日：2018-03-02

Applicant: Tsinghua University

Inventor： Songling Huang ,  Wei Zhao ,  Lisha Peng ,  Shen Wang ,  Di Cheng ,  Jiarui Dong

IPC: G01N27/83 ,  G06F111/10 ,  G06F30/20 ,  G01N17/00 ,  G06F30/23

Abstract: A method for reconstructing a defect includes: S1, establishing a database of magnetic flux leakage signals of a unit defect and acquiring a magnetic flux leakage signal of the unit defect; S2, acquiring a target magnetic flux leakage signal; S3, initially setting a scaling factor k; S4, constructing a forward model; S5, inputting the k into the forward model and performing forward prediction according to the k to acquire a predicted magnetic flux leakage signal for the defect to be detected; S6, calculating an error between the target magnetic flux leakage signal and the predicted magnetic flux leakage signal, and determining whether the error is smaller than an error threshold ε, if yes, executing S7; otherwise, executing S5 after the k is corrected; and S7, scaling the unit defect according to the k to acquire a final size of the defect to be detected.

公开(公告)号：US10906286B2

公开(公告)日：2021-02-02

申请号：US16252700

申请日：2019-01-20

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Lin Cong ,  Wei Zhao ,  Jin Zhang ,  Yu-Chien Tsai ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: B32B43/00 ,  B32B37/00 ,  B32B7/12 ,  B32B3/26 ,  B32B9/04 ,  B32B38/10

Abstract: The present invention relates to a method for transferring two-dimensional nanomaterials. The method comprises the following steps: S1, providing a first substrate and a two-dimensional nanomaterial layer on a surface of the first substrate; S2, covering the two-dimensional nanomaterial layer with a carbon nanotube film structure; S3, obtaining a composite structure comprising the two-dimensional nanomaterial layer and the carbon nanotube film structure by removing the first substrate with a corrosion solution; S4, cleaning the composite structure by placing the composite structure on a surface of a cleaning solution; S5, picking up the composite structure from the cleaning solution with a target substrate, by contacting the target substrate with the two-dimensional nanomaterial layer of the composite structure; and S6, removing the carbon nanotube film structure from the composite structure.

公开(公告)号：US10814598B2

公开(公告)日：2020-10-27

申请号：US16252703

申请日：2019-01-20

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Lin Cong ,  Wei Zhao ,  Jin Zhang ,  Yu-Chien Tsai ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: B32B37/00 ,  B32B3/26 ,  B32B7/12 ,  B32B15/14 ,  B82Y40/00 ,  B82Y30/00 ,  B82B3/00

Abstract: The present invention relates to a method for transferring two-dimensional nanomaterials. The method comprises: (S1) providing a first substrate with a two-dimensional nanomaterial layer on a surface of the first substrate and a carbon nanotube composite film comprising a carbon nanotube film structure and a nanomaterial layer stacked with each other; (S2) covering the two-dimensional nanomaterial layer with the carbon nanotube composite film, wherein the carbon nanotube film structure of the carbon nanotube composite film is in contact with the two-dimensional nanomaterial layer; (S3) obtaining a composite structure comprising the two-dimensional nanomaterial layer and the carbon nanotube composite film by removing the first substrate with a corrosion solution; (S4) placing the composite structure on a surface of a cleaning solution for cleaning; (S5) picking up the composite structure from the cleaning solution by contacting the target substrate with the two-dimensional nanomaterial layer; and (S6) removing the carbon nanotube composite film.

公开(公告)号：US10814597B2

公开(公告)日：2020-10-27

申请号：US16252701

申请日：2019-01-20

Applicant: Tsinghua University ,  HON HAI PRECISION INDUSTRY CO., LTD.

Inventor： Lin Cong ,  Wei Zhao ,  Jin Zhang ,  Yu-Chien Tsai ,  Kai-Li Jiang ,  Shou-Shan Fan

IPC: B32B37/00 ,  B82Y40/00 ,  B32B7/12 ,  B32B3/26 ,  B32B9/04 ,  B81C1/00 ,  B32B3/00 ,  B82Y30/00

Abstract: The present invention relates to a method for transferring two-dimensional nanomaterials. The method comprises the following steps: (S1) providing a first substrate with a two-dimensional nanomaterial layer on a surface of the first substrate; (S2) covering the two-dimensional nanomaterial layer with a carbon nanotube film structure; (S3) obtaining a composite structure comprising the two-dimensional nanomaterial layer and the carbon nanotube film structure by removing the first substrate with a corrosion solution to; (S4) placing the composite structure on a surface of a cleaning solution; (S5) providing a target substrate comprising at least one through hole, and picking up the composite structure from the cleaning solution with the target substrate by contacting the target substrate with the two-dimensional nanomaterial layer of the composite structure and covering the at least one through hole with two-dimensional nanomaterial layer; and (S6) removing the carbon nanotube film structure from the composite structure.

公开(公告)号：US10788454B2

公开(公告)日：2020-09-29

申请号：US16044590

申请日：2018-07-25

Applicant: Hubei University of Technology ,  Tsinghua University

Inventor： Songling Huang ,  Xiaochun Song ,  Lisha Peng ,  Wei Zhao ,  Shen Wang ,  Xinjie Yu ,  Shisong Li

IPC: G01N27/83

Abstract: A method for identifying a defect opening profile includes: acquiring a vertical component of a magnetic flux leakage signal of a defect; identifying right-angle features and corresponding right-angle position points of the defect from the vertical component; obtaining all possible right-angle types at each right-angle position point of the defect according to the corresponding right-angle feature of the vertical component; traversing all the possible right-angle types at each right-angle position point to determine respective optimal right-angle type at each right-angle position point; and drawing the defect opening profile according to the respective optimal right-angle type at each right-angle position point.