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1.
公开(公告)号:US11378548B2
公开(公告)日:2022-07-05
申请号:US17146703
申请日:2021-01-12
Applicant: Tsinghua University
Inventor: Songling Huang , Wenzhi Wang , Wei Zhao , Shen Wang , Zijing Huang , Xiaochun Song , Lisha Peng
Abstract: A device and a method for testing a steel defect based on internal and external magnetic perturbation. The device includes: a magnetizer comprising a magnetization source and a magnet yoke, arranged on a surface of a sample, and configured to generate two types of typical magnetic field regions applied to testing based on internal and external magnetic perturbation; a double-row magnetic sensor probe, configured to collect internal and external magnetic perturbation data; a master controller, configured to perform pre-processing on the internal and external magnetic perturbation data, and store the pre-processed data; scanner wheels, configured to generate a sampling trigger pulse during scanning to enable the master controller to receive the internal and external magnetic perturbation data from the probes; and a host computer, configured to analyze the pre-processed data uploaded by the master controller to obtain a defect quantitative result.
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公开(公告)号:US11150311B2
公开(公告)日:2021-10-19
申请号:US16904075
申请日:2020-06-17
Applicant: Tsinghua University
Inventor: Songling Huang , Wenzhi Wang , Lisha Peng , Wei Zhao , Shen Wang , Zijing Huang
IPC: G01R33/00 , G01R33/038 , H01F7/02
Abstract: A device and a method for detecting a defect contour with omnidirectionally equal sensitivity based on magnetic excitation are provided. The device includes a magnetic sensor array arranged in a spatially uniform magnetic field and configured to collect a magnetic field signal, and a data analysis module configured to analyze the magnetic field signal, extract a distorted magnetic field signal, and obtain an image of the defect contour based on the distorted magnetic field signal.
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