Invention Grant
- Patent Title: Secure erase for data corruption
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Application No.: US17158555Application Date: 2021-01-26
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Publication No.: US11238939B2Publication Date: 2022-02-01
- Inventor: Ting Luo , Kulachet Tanpairoj , Harish Reddy Singidi , Jianmin Huang , Preston Allen Thomson , Sebastien Andre Jean
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C11/34
- IPC: G11C11/34 ; G11C16/16 ; G11C16/04 ; G11C16/08 ; G11C11/56 ; G11C16/34 ; H01L27/11582 ; H01L27/11556

Abstract:
Disclosed in some examples are systems, methods, memory devices, and machine readable mediums for a fast secure data destruction for NAND memory devices that renders data in a memory cell unreadable. Instead of going through all the erase phases, the memory device may remove sensitive data by performing only the pre-programming phase of the erase process. Thus, the NAND doesn't perform the second and third phases of the erase process. This is much faster and results in data that cannot be reconstructed. In some examples, because the erase pulse is not actually applied and because this is simply a programming operation, data may be rendered unreadable at a per-page level rather than a per-block level as in traditional erases.
Public/Granted literature
- US20210151111A1 SECURE ERASE FOR DATA CORRUPTION Public/Granted day:2021-05-20
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