Invention Grant
- Patent Title: Counter-based read in memory device
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Application No.: US16771659Application Date: 2019-12-23
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Publication No.: US11244739B2Publication Date: 2022-02-08
- Inventor: Umberto Di Vincenzo , Riccardo Muzzetto , Ferdinando Bedeschi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Holland & Hart LLP
- International Application: PCT/IB2019/001260 WO 20191223
- International Announcement: WO2021/130510 WO 20210701
- Main IPC: G11C29/42
- IPC: G11C29/42 ; G11C29/44 ; G11C7/14 ; G11C29/20 ; G11C29/12

Abstract:
Methods and apparatuses with counter-based reading are described.
In a memory device, a memory cells of a codeword are accessed and respective voltages are generated. A reference voltage is generated and a logic state of each memory cell is determined based on the reference voltage and the respective generated cell voltage. The reference voltage is modified until a count of memory cells determined to be in a predefined logic state with respect to the last modified reference voltage value meets a criterium. In some embodiments the criterium may be an exact match between the memory cells count and an expected number of memory cells in the predefined logic state. In other embodiments, an error correction (ECC) algorithm may be applied while the difference between the count of cells in the predefined logic state and the expected number of cells in that state does not exceed a detection or correction power of the ECC.
In a memory device, a memory cells of a codeword are accessed and respective voltages are generated. A reference voltage is generated and a logic state of each memory cell is determined based on the reference voltage and the respective generated cell voltage. The reference voltage is modified until a count of memory cells determined to be in a predefined logic state with respect to the last modified reference voltage value meets a criterium. In some embodiments the criterium may be an exact match between the memory cells count and an expected number of memory cells in the predefined logic state. In other embodiments, an error correction (ECC) algorithm may be applied while the difference between the count of cells in the predefined logic state and the expected number of cells in that state does not exceed a detection or correction power of the ECC.
Public/Granted literature
- US20210225454A1 COUNTER-BASED READ IN MEMORY DEVICE Public/Granted day:2021-07-22
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