Invention Grant
- Patent Title: Systems and processes for increasing semiconductor device reliability
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Application No.: US16597224Application Date: 2019-10-09
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Publication No.: US11289441B2Publication Date: 2022-03-29
- Inventor: Sung Chul Joo , Jack Powell , Donald Farrell , Bradley Millon
- Applicant: Cree, Inc.
- Applicant Address: US NC Durham
- Assignee: Cree, Inc.
- Current Assignee: Cree, Inc.
- Current Assignee Address: US NC Durham
- Agency: BakerHostetler
- Main IPC: H01L23/66
- IPC: H01L23/66 ; H01L23/00 ; H01P11/00 ; H01P3/00

Abstract:
A system configured to increase a reliability of electrical connections in a device. The system including a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component. The lead includes an upper portion that includes a lower surface arranged on a lower surface thereof. The lower surface of the upper portion is arranged vertically above a first upper surface of a first pad connection portion; and the lower surface of the upper portion is arranged vertically above a second upper surface of the second pad connection portion. A process configured to increase a reliability of electrical connections in a device is also disclosed.
Public/Granted literature
- US20210111144A1 Systems and Processes for Increasing Semiconductor Device Reliability Public/Granted day:2021-04-15
Information query
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