Systems and processes for increasing semiconductor device reliability

    公开(公告)号:US11289441B2

    公开(公告)日:2022-03-29

    申请号:US16597224

    申请日:2019-10-09

    Applicant: Cree, Inc.

    Abstract: A system configured to increase a reliability of electrical connections in a device. The system including a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component. The lead includes an upper portion that includes a lower surface arranged on a lower surface thereof. The lower surface of the upper portion is arranged vertically above a first upper surface of a first pad connection portion; and the lower surface of the upper portion is arranged vertically above a second upper surface of the second pad connection portion. A process configured to increase a reliability of electrical connections in a device is also disclosed.

    Systems and Processes for Increasing Semiconductor Device Reliability

    公开(公告)号:US20210111144A1

    公开(公告)日:2021-04-15

    申请号:US16597224

    申请日:2019-10-09

    Applicant: Cree, Inc.

    Abstract: A system configured to increase a reliability of electrical connections in a device. The system including a lead configured to electrically connect a pad of at least one support structure to a pad of at least one electrical component. The lead includes an upper portion that includes a lower surface arranged on a lower surface thereof. The lower surface of the upper portion is arranged vertically above a first upper surface of a first pad connection portion; and the lower surface of the upper portion is arranged vertically above a second upper surface of the second pad connection portion. A process configured to increase a reliability of electrical connections in a device is also disclosed.

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