- 专利标题: Metal contamination test apparatus and method
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申请号: US16862354申请日: 2020-04-29
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公开(公告)号: US11302524B2公开(公告)日: 2022-04-12
- 发明人: Bingguo Wang , Hongxia Ma , Hongbin Zhu
- 申请人: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- 申请人地址: CN Wuhan
- 专利权人: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- 当前专利权人: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- 当前专利权人地址: CN Wuhan
- 代理机构: Bayes PLLC
- 主分类号: H01J49/26
- IPC分类号: H01J49/26 ; G01N23/223 ; H01J49/04 ; H01J49/10 ; H01J49/24 ; H01L21/67
摘要:
Embodiments of apparatus and method for testing metal contamination are disclosed. In an example, an apparatus for testing metal contamination includes a chamber in which a test object is placed, a gas supply configured to supply nitrogen gas into the chamber, a pressure controller configured to apply a pressure of at least about 1 torr in the chamber, and a measurement unit configured to measure a concentration of a metal from the test object.
公开/授权文献
- US20210249247A1 METAL CONTAMINATION TEST APPARATUS AND METHOD 公开/授权日:2021-08-12
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