Invention Grant
- Patent Title: Shallow trench isolation forming method and structures resulting therefrom
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Application No.: US16917159Application Date: 2020-06-30
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Publication No.: US11302567B2Publication Date: 2022-04-12
- Inventor: Szu-Ying Chen , Sen-Hong Syue , Huicheng Chang , Yee-Chia Yeo
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/762
- IPC: H01L21/762 ; H01L27/088 ; H01L21/8234 ; H01L29/06

Abstract:
A method includes forming a first plurality of fins in a first region of a substrate, a first recess being interposed between adjacent fins in the first region of the substrate, the first recess having a first depth and a first width, forming a second plurality of fins in a second region of the substrate, a second recess being interposed between adjacent fins in the second region of the substrate, the second recess having a second depth and a second width, the second width of the second recess being less than the first width of the first recess, the second depth of the second recess being less than the first depth of the first recess, forming a first dielectric layer in the first recess and the second recess, and converting the first dielectric layer in the first recess and the second recess to a treated dielectric layer.
Public/Granted literature
- US20210407847A1 SHALLOW TRENCH ISOLATION FORMING METHOD AND STRUCTURES RESULTING THEREFROM Public/Granted day:2021-12-30
Information query
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