Invention Grant
- Patent Title: Determining focus settings for specimen scans
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Application No.: US17195614Application Date: 2021-03-08
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Publication No.: US11330164B2Publication Date: 2022-05-10
- Inventor: Bryant Mantiply , Xiumei Liu , Matthew Giusti , Kai Cao , Richard Wallingford
- Applicant: KLA Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA Corporation
- Current Assignee: KLA Corporation
- Current Assignee Address: US CA Milpitas
- Agent Ann Marie Mewherter
- Main IPC: H04N5/232
- IPC: H04N5/232 ; G06T7/00

Abstract:
Methods and systems for determining focus settings for use in a specimen scan are provided. One method includes generating a focus map defined as values of best focus as a function of position on a specimen using output generated in one or more pre-focus swaths scanned on the specimen by an output acquisition subsystem configured to direct energy to a specimen, to detect energy from the specimen, and to generate output responsive to the detected energy. The method also includes interpolating the focus map to generate focus settings for a scan performed on the specimen during a process and storing information for the generated focus settings for use in the scan performed on the specimen during the process.
Public/Granted literature
- US20210297600A1 DETERMINING FOCUS SETTINGS FOR SPECIMEN SCANS Public/Granted day:2021-09-23
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