Invention Grant
- Patent Title: Estimating an error rate associated with memory
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Application No.: US16752859Application Date: 2020-01-27
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Publication No.: US11334413B2Publication Date: 2022-05-17
- Inventor: Sivagnanam Parthasarathy , Mustafa N. Kaynak , Patrick R. Khayat , Nicholas J. Richardson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Brooks, Cameron & Huebsch, PLLC
- Main IPC: G06F11/07
- IPC: G06F11/07 ; H03M13/00 ; H03M13/37 ; H03M13/11 ; G11C11/56 ; G06F11/10 ; G11C29/52 ; G11C29/56 ; G06F11/08 ; G11C29/00 ; G11C29/04

Abstract:
The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.
Public/Granted literature
- US20200159616A1 ESTIMATING AN ERROR RATE ASSOCIATED WITH MEMORY Public/Granted day:2020-05-21
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