Invention Grant
- Patent Title: Semiconductor device and method of manufacture
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Application No.: US16901757Application Date: 2020-06-15
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Publication No.: US11335589B2Publication Date: 2022-05-17
- Inventor: Yao-Wen Hsu , Ming-Che Ku , Neng-Jye Yang , Yu-Wen Wang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L21/02

Abstract:
An opening is formed within a dielectric material overlying a semiconductor substrate. The opening may comprise a via portion and a trench portion. During the manufacturing process a treatment chemical is placed into contact with the exposed surfaces in order to release charges that have built up on the surfaces. By releasing the charges, a surface change potential difference is reduced, helping to prevent galvanic corrosion from occurring during further manufacturing.
Public/Granted literature
- US20200312711A1 Semiconductor Device and Method of Manufacture Public/Granted day:2020-10-01
Information query
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