Invention Grant
- Patent Title: Memory cell and method
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Application No.: US16901885Application Date: 2020-06-15
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Publication No.: US11342334B2Publication Date: 2022-05-24
- Inventor: Meng-Han Lin , Han-Jong Chia , Sai-Hooi Yeong , Chi On Chui , Yu-Ming Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- Main IPC: H01L27/108
- IPC: H01L27/108 ; H01L49/02 ; H01L29/423

Abstract:
An improved memory cell architecture including a nanostructure field-effect transistor (nano-FET) and a horizontal capacitor extending at least partially under the nano-FET and methods of forming the same are disclosed. In an embodiment, semiconductor device includes a channel structure over a semiconductor substrate; a gate structure encircling the channel structure; a first source/drain region adjacent the gate structure; and a capacitor adjacent the first source/drain region, the capacitor extending under the first source/drain region and the gate structure in a cross-sectional view.
Public/Granted literature
- US20210391331A1 Memory Cell and Method Public/Granted day:2021-12-16
Information query
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