Invention Grant
- Patent Title: Layout pattern for magnetoresistive random access memory
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Application No.: US16792271Application Date: 2020-02-16
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Publication No.: US11374055B2Publication Date: 2022-06-28
- Inventor: Ya-Huei Tsai , Rai-Min Huang , Yu-Ping Wang , Hung-Yueh Chen
- Applicant: UNITED MICROELECTRONICS CORP.
- Applicant Address: TW Hsin-Chu
- Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee: UNITED MICROELECTRONICS CORP.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Priority: TW109101457 20200116
- Main IPC: H01L27/22
- IPC: H01L27/22 ; H01L23/528 ; H01L43/02 ; G11C11/16 ; H01F10/32 ; H01L43/10

Abstract:
A layout pattern for magnetoresistive random access memory (MRAM) includes a substrate having a first active region, a second active region, and a word line connecting region between the first active region and the second active region and a gate pattern extending from the first active region to the second active region, in which the gate pattern includes a H-shape according to a top view. Preferably, the gate pattern includes a first gate pattern extending along a first direction from the first active region to the second active region, a second gate pattern extending along the first direction from the first active region to the second active region, and a third gate pattern connecting the first gate pattern and the second gate pattern along a second direction.
Public/Granted literature
- US20210225933A1 LAYOUT PATTERN FOR MAGNETORESISTIVE RANDOM ACCESS MEMORY Public/Granted day:2021-07-22
Information query
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