Invention Grant
- Patent Title: Contact probe and relative probe head of an apparatus for testing electronic devices
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Application No.: US17244498Application Date: 2021-04-29
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Publication No.: US11442080B2Publication Date: 2022-09-13
- Inventor: Roberto Crippa , Raffaele Vallauri
- Applicant: TECHNOPROBE S.P.A.
- Applicant Address: IT Cernusco Lombardone
- Assignee: TECHNOPROBE S.P.A.
- Current Assignee: TECHNOPROBE S.P.A.
- Current Assignee Address: IT Cernusco Lombardone
- Agency: Seed Intellectual Property Law Group LLP
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01R1/073 ; G01R1/067 ; G01R3/00
Abstract:
A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
Public/Granted literature
- US20210247422A1 CONTACT PROBE AND RELATIVE PROBE HEAD OF AN APPARATUS FOR TESTING ELECTRONIC DEVICES Public/Granted day:2021-08-12
Information query
