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公开(公告)号：US11442080B2
公开(公告)日：2022-09-13
申请号：US17244498
申请日：2021-04-29
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto Crippa , Raffaele Vallauri
Abstract: A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
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公开(公告)号：US12044703B2
公开(公告)日：2024-07-23
申请号：US17783433
申请日：2020-12-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Raffaele Vallauri , Fabio Morgana
IPC: G01R1/067
CPC classification number: G01R1/06716 , G01R1/06755
Abstract: A contact probe having a first end portion and a second end portion, a probe body extended along a longitudinal development direction between the first end portion and the second end portion is disclosed. The probe body has a pair of arms separated by a slot and extending according to the longitudinal development direction and a conductive insert extended along the longitudinal development direction, in a bending plane of the contact probe. The conductive insert is made of a first material and the contact probe is made of a second material and the first material has a lower electrical resistivity than an electrical resistivity of the second material. The conductive insert is a power transmission element of the contact probe and the arms are structural support elements of the contact probe during a deformation of the probe body.
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公开(公告)号：US12019111B2
公开(公告)日：2024-06-25
申请号：US16677581
申请日：2019-11-07
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Flavio Maggioni , Raffaele Vallauri
CPC classification number: G01R3/00 , G01R1/07342 , H05K3/0029 , H05K3/4061 , H05K3/4679
Abstract: A method of manufacturing a multi-layer for a probe card comprises providing first contact pads on an exposed face of a first dielectric layer and second contact pads on an exposed face of a last dielectric layer. Each dielectric layer is laser ablated to realize pass-through structures and the pass-through structures are conductively filled to realize conductive structures. The dielectric layers are superimposed in a way that each conductive structure contacts a corresponding conductive structure of a contiguous dielectric layer in the multi-layer and forms conductive paths electrically connected the first and second contact pads. The second contact pads having a greater distance between its symmetry centers than the first contact pads, the multi-layer thus performing a spatial transformation between the first and second contact pads connected through the connective paths.
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公开(公告)号：US10551433B2
公开(公告)日：2020-02-04
申请号：US15703614
申请日：2017-09-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Raffaele Vallauri , Emanuele Bertarelli , Daniele Perego
Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.
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公开(公告)号：US10509056B2
公开(公告)日：2019-12-17
申请号：US15257443
申请日：2016-09-06
Applicant: Technoprobe S.p.A.
Inventor： Riccardo Liberini , Raffaele Vallauri , Giuseppe Crippa
IPC: G01R1/073
Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.
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Patent Agency Ranking
公开(公告)号：US20180003767A1
公开(公告)日：2018-01-04
申请号：US15703614
申请日：2017-09-13
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto Crippa , Raffaele Vallauri , Emanuele Bertarelli , Daniele Perego
CPC classification number: G01R31/2891 , G01R1/06733 , G01R1/0675 , G01R1/07314 , G01R1/07357 , H01R13/2435 , H01R13/42
Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.
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公开(公告)号：US11016122B2
公开(公告)日：2021-05-25
申请号：US16439527
申请日：2019-06-12
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto Crippa , Raffaele Vallauri
Abstract: A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
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公开(公告)号：US10228392B2
公开(公告)日：2019-03-12
申请号：US15352448
申请日：2016-11-15
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto Crippa , Giuseppe Crippa , Raffaele Vallauri
Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.
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公开(公告)号：US20180024166A1
公开(公告)日：2018-01-25
申请号：US15718430
申请日：2017-09-28
Applicant: TECHNOPROBE S.p.A.
Inventor： Daniele Acconcia , Raffaele Vallauri
CPC classification number: G01R1/07378 , G01R1/06716 , G01R1/06733 , G01R1/06744 , G01R1/06755 , G01R1/06772 , G01R1/07314 , G01R1/07357
Abstract: It is described a contact probe for a testing head for a testing apparatus of electronic devices, the probe comprising a probe body extended in a longitudinal direction between respective end portions adapted to contact respective contact pads, the second end being a contact tip adapted to abut onto a contact pad of the device under test, the body of each contact probe having a length of less than 5000 μm, and including at least one pass-through opening extending along its longitudinal dimension. Conveniently, the at least one pass-through opening is filled by a filling material, in order to define at least one first and one second lateral portions in the body, being parallel and joined to each other by a connecting central portion realized by the filling material at the pass-through opening, the connecting central portion made of the filling material acting as a strengthening element.
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公开(公告)号：US11029337B2
公开(公告)日：2021-06-08
申请号：US16550089
申请日：2019-08-23
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto Crippa , Raffaele Vallauri
Abstract: A testing head comprises at least one guide provided with a plurality of guide holes, and a plurality of contact elements housed in the plurality of guide holes. Suitably, the at least one guide comprises a plurality of conductive layers, each conductive layer: including holes of a corresponding plurality of group of the plurality of guide holes and electrically connecting a corresponding group of contact elements housed in the guide holes of the group, contact elements of a group being adapted to carry a same type of signal. The at least one guide is a multilayer comprising a plurality of non-conductive layers, and the conductive layers are arranged on respective faces of a layer of the plurality of non-conductive layers.
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