Invention Grant
- Patent Title: Circuit and method for at speed detection of a word line fault condition in a memory circuit
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Application No.: US16742292Application Date: 2020-01-14
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Publication No.: US11521697B2Publication Date: 2022-12-06
- Inventor: Shishir Kumar , Abhishek Pathak
- Applicant: STMicroelectronics International N.V.
- Applicant Address: NL Schiphol
- Assignee: STMicroelectronics International N.V.
- Current Assignee: STMicroelectronics International N.V.
- Current Assignee Address: NL Schiphol
- Agency: Crowe & Dunlevy
- Main IPC: G11C29/38
- IPC: G11C29/38 ; G11C29/44 ; G11C8/10

Abstract:
A row decoder located on one side of a memory array selectively drives word lines in response to a row address. A word line fault detection circuit located on an opposite side of the first memory array operates to detect an open word line fault between the opposed sides of the memory array. The word line fault detection circuit includes a first clamp circuit that operates to clamp the word lines to ground. An encoder circuit encodes signals on the word lines to generate an encoded address. The encoded address is compared to the row address by a comparator circuit which sets an error flag indicating the open word line fault has been detected if the encoded address does not match the row address.
Public/Granted literature
- US20200243153A1 CIRCUIT AND METHOD FOR AT SPEED DETECTION OF A WORD LINE FAULT CONDITION IN A MEMORY CIRCUIT Public/Granted day:2020-07-30
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