- 专利标题: Plasma processing systems and methods for chemical processing a substrate
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申请号: US17003734申请日: 2020-08-26
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公开(公告)号: US11521834B2公开(公告)日: 2022-12-06
- 发明人: Peter Ventzek , Alok Ranjan , Mitsunori Ohata
- 申请人: Tokyo Electron Limited
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Slater Matsil, LLP
- 主分类号: H01J37/32
- IPC分类号: H01J37/32
摘要:
A plasma processing system includes a radical source chamber including a gas inlet, an electrode coupled to a radio frequency (RF) power source, where the electrode is configured to generate radicals within the radical source chamber, and an exit for radicals generated within the radical source chamber; a plenum attached to the exit of the radical source chamber, where the plenum is made of a first thermal conductor, and where the walls of the plenum include openings for gas flow; and a process chamber connected to the radical source chamber through the plenum. The process chamber includes a substrate holder disposed below the plenum; a gas outlet below the substrate holder; and process chamber walls including a second thermal conductor, where the process chamber walls of the process chamber are thermally coupled to the walls of the plenum.
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