Invention Grant
- Patent Title: Method, device, and system for etching silicon oxide film
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Application No.: US17397561Application Date: 2021-08-09
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Publication No.: US11626290B2Publication Date: 2023-04-11
- Inventor: Osamu Yokoyama , Kwangpyo Choi , Kazuki Hashimoto , Rio Shimizu , Takashi Kobayashi , Takashi Sakuma , Shinya Okabe
- Applicant: TOKYO ELECTRON LIMITED
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Fenwick & West LLP
- Priority: JPJP2020-135972 20200811
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/67

Abstract:
A method of etching silicon oxide on a surface of a substrate is provided. The method comprises alternately repeating heating the substrate to a heating temperature of 60° C. or higher, supplying hydrogen fluoride gas and ammonia gas onto the substrate to react with the silicon oxide, and modifying the silicon oxide to obtain a reaction product, and removing at least a portion of the reaction product from the substrate while stopping the supply of the above gases and continuing to heat the substrate at the heating temperature; and when a process gas that is at least one of the hydrogen fluoride gas and the ammonia gas is supplied, while continuing to supply the process gas from an upstream side of a flow path, closing a valve disposed in the flow path to pressurize the process gas in the flow path, and then opening the valve.
Information query
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