Invention Grant
- Patent Title: Apparatus and methods for detecting invasive attacks within integrated circuits
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Application No.: US17003313Application Date: 2020-08-26
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Publication No.: US11651071B2Publication Date: 2023-05-16
- Inventor: Bohdan Karpinskyy , Mijung Noh , Jieun Park , Yongki Lee , Juyeon Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Myers Bigel, P.A.
- Priority: KR 20200003185 2020.01.09
- Main IPC: G06F21/55
- IPC: G06F21/55 ; G06F7/58 ; H03K3/84 ; H03K19/20 ; H03K19/21

Abstract:
An apparatus includes an integrated circuit and a plurality of conducting wires disposed on the integrated circuit. The integrated circuit includes: (i) a signal generation circuit, which is configured to generate random signal and selection signal based on random or pseudo-random numbers, (ii) a transmitting circuit configured to select at least one from among the plurality of conducting wires based on the selection signal and to output the random signal through the at least one conducting wire, and (iii) a receiving circuit configured to detect an invasive attack on the integrated circuit based on signal received through the at least one conducting wire.
Public/Granted literature
- US20210216626A1 APPARATUS AND METHODS FOR DETECTING INVASIVE ATTACKS WITHIN INTEGRATED CIRCUITS Public/Granted day:2021-07-15
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