Invention Grant
- Patent Title: Contact structure
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Application No.: US17370684Application Date: 2021-07-08
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Publication No.: US11728170B2Publication Date: 2023-08-15
- Inventor: Hong-Ying Lin , Cheng-Yi Wu , Alan Tu , Chung-Liang Cheng , Li-Hsuan Chu , Ethan Hsiao , Hui-Lin Sung , Sz-Yuan Hung , Sheng-Yung Lo , C. W. Chiu , Chih-Wei Hsieh , Chin-Szu Lee
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Duane Morris LLP
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01L21/768 ; H01L23/532 ; H01L23/535 ; H01L29/08 ; H01L29/417 ; H01L29/66 ; H01L29/78 ; C23C16/16

Abstract:
A semiconductor device includes: a fin structure disposed on a substrate; a gate feature that traverses the fin structure to overlay a central portion of the fin structure; a pair of source/drain features, along the fin structure, that are disposed at respective sides of the gate feature; and a plurality of contact structures that are formed of tungsten, wherein a gate electrode of the gate feature and the pair of source/drain features are each directly coupled to a respective one of the plurality of contact structures.
Public/Granted literature
- US20210335616A1 CONTACT STRUCTURE Public/Granted day:2021-10-28
Information query
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