- 专利标题: Package comprising an ion-trap and method of fabrication
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申请号: US16913932申请日: 2020-06-26
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公开(公告)号: US11749518B2公开(公告)日: 2023-09-05
- 发明人: Jungsang Kim , Kai Hudek , Geert Vrijsen , Robert Spivey , Peter Maunz
- 申请人: Duke University
- 申请人地址: US NC Durham
- 专利权人: Duke University
- 当前专利权人: Duke University
- 当前专利权人地址: US NC Durham
- 代理机构: KAPLAN BREYER SCHWARZ, LLP
- 分案原申请号: US15935312 2018.03.26
- 主分类号: H01J49/42
- IPC分类号: H01J49/42 ; G06N10/00 ; H01J49/16 ; H01J49/24
摘要:
A package-level, integrated high-vacuum ion-chip enclosure having improved thermal characteristics is disclosed. Enclosures in accordance with the present invention include first and second chambers that are located on opposite sides of a chip carrier, where the chambers are fluidically coupled via a conduit through the chip carrier. The ion trap is located in the first chamber and disposed on the chip carrier. A source for generating an atomic flux is located in the second chamber. The separation of the source and ion trap in different chambers affords thermal isolation between them, while the conduit between the chambers enables the ion trap to receive the atomic flux.
公开/授权文献
- US20200335320A1 Package Comprising an Ion-Trap and Method of Fabrication 公开/授权日:2020-10-22
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