Invention Grant
- Patent Title: Techniques for measuring depth and polarization from a single sensor
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Application No.: US17164679Application Date: 2021-02-01
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Publication No.: US11758109B2Publication Date: 2023-09-12
- Inventor: Wenshou Chen , Yiyi Ren , Guansong Liu , Badri Padmanabhan , Alireza Bonakdar , Richard Mann
- Applicant: OMNIVISION TECHNOLOGIES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: CHRISTENSEN O'CONNOR JOHNSON KINDNESS PLLC
- Main IPC: H04N13/218
- IPC: H04N13/218 ; G06T7/593 ; H04N23/55 ; H04N13/00

Abstract:
In some embodiments, an image sensor is provided. The image sensor comprises a plurality of photodiodes arranged as a photodiode array. The photodiodes of the photodiode array are arranged into a first quadrant, a second quadrant, a third quadrant, and a fourth quadrant. A first polarization filter and a first telecentric lens are aligned with the first quadrant. A second polarization filter and a second telecentric lens are aligned with the second quadrant. A third polarization filter and a third telecentric lens are aligned with the third quadrant. A fourth telecentric lens is aligned with the fourth quadrant.
Public/Granted literature
- US20220247992A1 TECHNIQUES FOR MEASURING DEPTH AND POLARIZATION FROM A SINGLE SENSOR Public/Granted day:2022-08-04
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