Invention Grant
- Patent Title: Substrate processing method, storage medium, and substrate processing apparatus
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Application No.: US17959517Application Date: 2022-10-04
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Publication No.: US11774854B2Publication Date: 2023-10-03
- Inventor: Yusaku Hashimoto , Kouichirou Tanaka , Masahiro Fukuda , Atsushi Ookouchi
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 20127488 2020.07.28
- Main IPC: G03F7/16
- IPC: G03F7/16

Abstract:
A method of processing a substrate includes: performing a first developing process of moving a nozzle having one end surface and a discharge port opened at the end surface while making the end surface come into contact with a developer on a front surface of a substrate in a state in which the nozzle is disposed so that the end surface faces the front surface and the developer is discharged from the discharge port at a first flow rate while rotating the substrate; and after the first developing process, performing a second developing process of discharging the developer from the discharge port at a second flow rate higher than the first flow rate in a state in which the end surface is in contact with the developer on the front surface at a position facing a center of the front surface of the substrate while rotating the substrate.
Public/Granted literature
- US20230026275A1 SUBSTRATE PROCESSING METHOD, STORAGE MEDIUM, AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2023-01-26
Information query
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