An integrated circuit includes a plurality of power transistor driver channels for driving external loads. The driver channels can be selectively configured as high-side (HS) or low-side (LS) driver channels. The integrated circuit includes, for each driver channel, a respective on-state test circuit and a respective controller. The on-state test circuits can be selectively configured to test for HS overcurrent conditions, LS overcurrent conditions, HS open load conditions, and LS open load conditions.