Invention Grant
- Patent Title: Optics, device, and system for assaying and imaging
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Application No.: US16526864Application Date: 2019-07-30
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Publication No.: US11885952B2Publication Date: 2024-01-30
- Inventor: Stephen Y. Chou , Wei Ding , Ji Qi , Yuecheng Zhang , Wu Chou , Mingquan Wu , Xing Li , Jun Tian
- Applicant: Essenlix Corporation
- Applicant Address: US NJ Monmouth Junction
- Assignee: Essenlix Corporation
- Current Assignee: Essenlix Corporation
- Current Assignee Address: US NJ Monmouth Junction
- Main IPC: G02B21/34
- IPC: G02B21/34 ; G01N33/543 ; G01N33/50

Abstract:
A method of assaying an analyte in a sample is disclosed. The method includes having a sample holder with a sample contact area for contacting a sample with an analyte, having a plurality of calibration structures on the sample contact area of the sample holder, imaging a part of the sample contact area that has the calibration structures, and using an algorithm that includes an image, calibration structures in the image, and artificial intelligence and/or machine learning to identify the analyte and/or determine the analyte concentration.
Public/Granted literature
- US20200033579A1 Optics, Device, and System for Assaying and Imaging Public/Granted day:2020-01-30
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B21/00 | 显微镜 |
G02B21/34 | .显微镜载物片,例如,在载物片上安装试样 |