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公开(公告)号：US20240309369A1
公开(公告)日：2024-09-19
申请号：US18388193
申请日：2023-11-09
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun Tian , Wu Chou
IPC: C12N15/113 , A61K31/7088 , A61K45/06 , A61K47/54 , A61P31/04
CPC classification number: C12N15/113 , A61K31/7088 , A61K45/06 , A61K47/554 , A61P31/04 , C12N15/1137 , C12N2310/127 , C12N2310/3515 , C12Y305/02006
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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公开(公告)号：US11933720B2
公开(公告)日：2024-03-19
申请号：US17621216
申请日：2020-06-22
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Jun Tian , Wu Chou , Hongbing Li
CPC classification number: G01N21/31 , G01N21/03 , G01N2021/0346 , G01N2021/3129
Abstract: The disclosure provides an apparatus, a device, and methods for improving optical analysis of a thin layer of a sample between two plates, particularly for multiple wavelengths.
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公开(公告)号：US11733151B2
公开(公告)日：2023-08-22
申请号：US17284083
申请日：2020-04-06
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wu Chou , Xing Li , Hongbing Li , Yuecheng Zhang , Mingquan Wu , Wei Ding , Jun Tian
CPC classification number: G01N15/1475 , G06N20/00 , G06T7/0012 , G06T7/10 , G06T7/40 , G06T7/62 , G06T2207/10056 , G06T2207/30004 , G06T2207/30024 , G06T2207/30204
Abstract: The present invention is related to, among other things, the devices and methods that improve the accuracy and reliability of an assay, even when the assay device and/or the operation of the assay device has certain errors, and in some embodiments the errors are random.
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公开(公告)号：US12248533B2
公开(公告)日：2025-03-11
申请号：US18101109
申请日：2023-01-24
Applicant: Essenlix Corporation
Inventor： Xing Li , Wu Chou , Stephen Y. Chou , Wei Ding , Ji Qi
IPC: G06F18/214 , G06N3/042 , G06N3/045 , G06N3/08 , G06T5/50 , G06T7/00 , G06T7/11 , G06T7/70 , G06V10/22
Abstract: The present disclosure relates to devices, apparatus and methods of improving the accuracy of image-based assay, that uses imaging system having uncertainties or deviations (imperfection) compared with an ideal imaging system. One aspect of the present invention is to add the monitoring marks on the sample holder, with at least one of their geometric and/optical properties of the monitoring marks under predetermined and known, and taking images of the sample with the monitoring marks, and train a machine learning model using the images with the monitoring mark.
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公开(公告)号：US11846582B2
公开(公告)日：2023-12-19
申请号：US17858931
申请日：2022-07-06
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Ji Qi , Jun Tian , Wu Chou
CPC classification number: G01N21/0303 , G01N1/2813 , G01N21/25 , G01N21/6458 , G01N33/49 , G01N2021/035 , G01N2021/6439 , G01N2201/0221
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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Patent Agency Ranking
公开(公告)号：US10955334B2
公开(公告)日：2021-03-23
申请号：US16771502
申请日：2018-12-14
Applicant: Essenlix Corporation
Inventor： Stephen Chou , Wei Ding , Ji Qi , Jun Tian , Wu Chou
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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公开(公告)号：US20200378886A1
公开(公告)日：2020-12-03
申请号：US16771502
申请日：2018-12-14
Applicant: Essenlix Corporation
Inventor： Stephen CHOU , Wei DING , Ji QI , Jun Tian , Wu Chou
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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公开(公告)号：US20240175801A1
公开(公告)日：2024-05-30
申请号：US18505118
申请日：2023-11-09
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun Tian , Wu Chou
CPC classification number: G01N21/0303 , G01N1/2813 , G01N21/25 , G01N21/6458 , G01N33/49 , G01N2021/035 , G01N2021/6439 , G01N2201/0221
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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公开(公告)号：US11733500B2
公开(公告)日：2023-08-22
申请号：US17266475
申请日：2019-08-16
Applicant: Essenlix Corporation
Inventor： Stephen Y. Chou , Wei Ding , Wu Chou , Ji Qi , Jun Tian , Yuecheng Zhang , Mingquan Wu
CPC classification number: G02B21/0008 , G01J3/524 , G02B21/0032 , G06N20/00 , G06T7/90 , H04N23/51 , H04N23/55
Abstract: Disclosed is an apparatus and method for imaging: a side-view of a object on a surface, a Contact Angle of a liquid object, the color of an object, or combinations thereof.
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公开(公告)号：US20210262920A1
公开(公告)日：2021-08-26
申请号：US17175585
申请日：2021-02-12
Applicant: Essenlix Corporation
Inventor： Stephen Y. CHOU , Wei DING , Ji QI , Jun Tian , Wu Chou
Abstract: Among other things, the present invention is related to devices and methods for improving optical analysis of a thin layer of a sample sandwiched between containing between two plates.
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