• Patent Title: Method for measuring concentration of fluorine gas in halogen fluoride-containing gas using mass spectrometer
  • Application No.: US17608527
    Application Date: 2020-11-12
  • Publication No.: US11984308B2
    Publication Date: 2024-05-14
  • Inventor: Atsushi Suzuki
  • Applicant: SHOWA DENKO K.K.
  • Applicant Address: JP Tokyo
  • Assignee: Resonac Corporation
  • Current Assignee: Resonac Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP 19214260 2019.11.27
  • International Application: PCT/JP2020/042274 2020.11.12
  • International Announcement: WO2021/106601A 2021.06.03
  • Date entered country: 2021-11-03
  • Main IPC: H01J49/04
  • IPC: H01J49/04 H01J49/00 H01J49/40
Method for measuring concentration of fluorine gas in halogen fluoride-containing gas using mass spectrometer
Abstract:
A method for measuring the concentration of fluorine gas (F2) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.
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