Invention Grant
- Patent Title: Method for measuring concentration of fluorine gas in halogen fluoride-containing gas using mass spectrometer
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Application No.: US17608527Application Date: 2020-11-12
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Publication No.: US11984308B2Publication Date: 2024-05-14
- Inventor: Atsushi Suzuki
- Applicant: SHOWA DENKO K.K.
- Applicant Address: JP Tokyo
- Assignee: Resonac Corporation
- Current Assignee: Resonac Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP 19214260 2019.11.27
- International Application: PCT/JP2020/042274 2020.11.12
- International Announcement: WO2021/106601A 2021.06.03
- Date entered country: 2021-11-03
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/00 ; H01J49/40

Abstract:
A method for measuring the concentration of fluorine gas (F2) contained in a halogen fluoride-containing gas using an analysis apparatus having a halogen fluoride-containing gas supply source, a fluorine-containing gas supply source, a tube, a capillary, and a mass spectrometer, the method including, before measuring the concentration of fluorine gas, performing passivation treatment on the tube and the capillary using a passivation gas containing a fluorine-containing gas supplied from the fluorine-containing gas supply source.
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