Invention Grant
- Patent Title: Semiconductor device and method for forming the same
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Application No.: US18335816Application Date: 2023-06-15
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Publication No.: US12022665B2Publication Date: 2024-06-25
- Inventor: Shy-Jay Lin , Chien-Min Lee , Hiroki Noguchi , MingYuan Song , Yen-Lin Huang , William Joseph Gallagher
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Slater Matsil, LLP
- The original application number of the division: US17216162 2021.03.29
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/768 ; H01L21/8234 ; H01L23/528 ; H10B61/00

Abstract:
A device includes a substrate having a first side and a second side, a first transistor that includes a first gate over a first protrusion and a first source region and a first drain region interposing the first protrusion, a first buried contact disposed adjacent to the first protrusion and having at least a portion extending into the substrate, a first contact plug disposed over the first drain region, first conductive lines disposed over the first contact plug and electrically connecting to the first drain region by the first contact plug, first via penetrating through the substrate and connecting the first buried contact; and second conductive lines disposed over the second side of the substrate and electrically connecting to the first via. The first buried contact is electrically connecting to the first source region or the first gate.
Public/Granted literature
- US20230345738A1 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME Public/Granted day:2023-10-26
Information query
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