Invention Grant
- Patent Title: Sample measurement device and sample measurement method
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Application No.: US16824198Application Date: 2020-03-19
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Publication No.: US12078648B2Publication Date: 2024-09-03
- Inventor: Masaki Shiba , Hiroki Kotake , Akihito Kato
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe
- Agency: Crowell & Moring LLP
- Priority: JP 19061846 2019.03.27
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N33/49 ; G01N35/02 ; G01N35/10

Abstract:
Disclosed is a sample measurement device comprising a first processing unit that performs a first measurement on a sample contained in a first container in a first cycle; a second processing unit that performs a second measurement on a sample contained in a second container in a second cycle different from the first cycle; and a relay section which is disposed between the first processing unit and the second processing unit and in which the second container is positioned, wherein the first processing unit performs a transferring operation of transferring the second container to the relay section, and the second processing unit performs a receiving operation of receiving the second container that has been transferred to the relay section from the relay section.
Public/Granted literature
- US20200309801A1 SAMPLE MEASUREMENT DEVICE AND SAMPLE MEASUREMENT METHOD Public/Granted day:2020-10-01
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