- Patent Title: Method for epitaxially depositing a material on a substrate by flowing a process gas across the substrate from an upper gas inlet to an upper gas outlet and flowing a purge gas from a lower gas inlet to a lower gas outlet
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Application No.: US17317565Application Date: 2021-05-11
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Publication No.: US12091749B2Publication Date: 2024-09-17
- Inventor: Tetsuya Ishikawa , Swaminathan T. Srinivasan , Matthias Bauer , Manjunath Subbanna , Ala Moradian , Kartik Bhupendra Shah , Errol Antonio C Sanchez , Michael R. Rice , Peter Reimer , Marc Shull
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: C30B25/14
- IPC: C30B25/14 ; C23C16/44 ; C23C16/458 ; C23C16/46 ; C23C16/52 ; C30B25/10 ; C30B25/12 ; C30B25/16

Abstract:
Embodiments described herein include processes and apparatuses relate to epitaxial deposition. A method for epitaxially depositing a material is provided and includes positioning a substrate on a substrate support surface of a susceptor within a process volume of a chamber body, where the process volume contains upper and lower chamber regions. The method includes flowing a process gas containing one or more chemical precursors from an upper gas inlet on a first side of the chamber body, across the substrate, and to an upper gas outlet on a second side of the chamber body, flowing a purge gas from a lower gas inlet on the first side of the chamber body, across the lower surface of the susceptor, and to a lower gas outlet on the second side of the chamber body, and maintaining a pressure of the lower chamber region greater than a pressure of the upper chamber region.
Public/Granted literature
- US20220364229A1 MULTI-PORT EXHAUST SYSTEM FOR EPITAXIAL DEPOSITION CHAMBER Public/Granted day:2022-11-17
Information query
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