Invention Grant
- Patent Title: Substrate processing method and substrate processing apparatus
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Application No.: US16823873Application Date: 2020-03-19
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Publication No.: US12104251B2Publication Date: 2024-10-01
- Inventor: Tatsuya Yamaguchi , Syuji Nozawa
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: TOKYO ELECTRON LIMITED
- Current Assignee: TOKYO ELECTRON LIMITED
- Current Assignee Address: JP Tokyo
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer; Tanya E. Harkins
- Priority: JP 19055096 2019.03.22
- Main IPC: C23C16/00
- IPC: C23C16/00 ; C23C16/02 ; C23C16/40 ; C23C16/48

Abstract:
A substrate processing method includes: forming a coating film so as to cover a front surface of the substrate, the substrate having a recess formed in the front surface and in which an organic film is formed; heating the substrate to turn the organic film into a gas, removing the gas from an interior of the recess by causing the gas to pass through the coating film, and forming in the substrate a sealed space surrounded by the recess and the coating film; supplying a processing gas into the sealed space; and irradiating the substrate with a light to activate the processing gas in the sealed space, causing a reaction product gas to pass through the coating film, and removing the reaction product gas, wherein the reaction product gas is generated by a reaction between a residue of the organic film and the activated processing gas in the sealed space.
Public/Granted literature
- US20200299840A1 Substrate Processing Method and Substrate Processing Apparatus Public/Granted day:2020-09-24
Information query
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