Invention Grant
- Patent Title: System for at least one of calibration or quality control of an FFS x-ray system
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Application No.: US17953706Application Date: 2022-09-27
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Publication No.: US12154751B2Publication Date: 2024-11-26
- Inventor: Marcus Radicke
- Applicant: Siemens Healthcare GmbH
- Applicant Address: DE Erlangen
- Assignee: Siemens Healthcare GmbH
- Current Assignee: Siemens Healthcare GmbH
- Current Assignee Address: DE Erlangen
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: DE102021210897.0 20210929
- Main IPC: H01J35/14
- IPC: H01J35/14 ; A61B6/00 ; A61B6/40 ; A61B6/58 ; H01J35/06 ; H01J35/30 ; H05G1/52
Abstract:
One or more example embodiments relates to a system for calibration and/or for quality control of an FFS X-ray system, a corresponding FFS X-ray system, a control facility suitable for it and to a method for calibration and/or for quality control of the FFS X-ray system.
Public/Granted literature
- US20230097505A1 SYSTEM FOR AT LEAST ONE OF CALIBRATION OR QUALITY CONTROL OF AN FFS X-RAY SYSTEM Public/Granted day:2023-03-30
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