Invention Application
- Patent Title: Methods and devices for achieving alignment of a beam-propagation axis with a center of an aperture in a charged-particle-beam optical system
- Patent Title (中): 用于实现光束传播轴与带电粒子束光学系统中孔径的中心对准的方法和装置
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Application No.: US09765530Application Date: 2001-01-19
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Publication No.: US20010010362A1Publication Date: 2001-08-02
- Inventor: Hiroyasu Simizu
- Applicant: Nikon Corporation
- Applicant Address: null
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: null
- Priority: JP2000-012621 20000121
- Main IPC: G21K001/08
- IPC: G21K001/08 ; H01J003/14 ; H01J003/26 ; H01J049/42

Abstract:
Methods and devices are disclosed for aligning a beam-propagation axis with the center of an aperture, especially an aperture configured to limit the aperture angle of the charged particle beam. In an exemplary method, an alignment-measurement aperture is provided at an imaging plane of a charged-particle-beam (CPB) optical system, and a beam detector is downstream of the alignment-measurement aperture. A scanning deflector is energized to cause the beam to be scanned in two dimensions, transverse to an optical axis, over the aperture. Meanwhile, the beam detector obtains an image of beam intensity in the two dimensions. In the image a maximum-intensity point is identified, corresponding to the propagation axis. Based on the two-dimensional image, the beam is deflected as required to align the propagation axis with the aperture center.
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