发明申请
US20050002231A1 Nonvolatile semiconductor memory and manufacturing method for the same
有权
非易失性半导体存储器及其制造方法相同
- 专利标题: Nonvolatile semiconductor memory and manufacturing method for the same
- 专利标题(中): 非易失性半导体存储器及其制造方法相同
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申请号: US10724103申请日: 2003-12-01
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公开(公告)号: US20050002231A1公开(公告)日: 2005-01-06
- 发明人: Yoshio Ozawa , Masayuki Tanaka , Fumitaka Arai
- 申请人: Yoshio Ozawa , Masayuki Tanaka , Fumitaka Arai
- 申请人地址: JP Tokyo
- 专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人: KABUSHIKI KAISHA TOSHIBA
- 当前专利权人地址: JP Tokyo
- 优先权: JP2003-192493 20030704
- 主分类号: G11C11/34
- IPC分类号: G11C11/34 ; H01L21/28 ; H01L21/336 ; H01L21/8247 ; H01L27/115 ; H01L29/788 ; H01L29/792
摘要:
The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.
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