发明申请
US20080135876A1 TRENCH CAPACITORS WITH INSULATING LAYER COLLARS IN UNDERCUT REGIONS
失效
在内陆地区具有绝缘层的TRENCH电容器
- 专利标题: TRENCH CAPACITORS WITH INSULATING LAYER COLLARS IN UNDERCUT REGIONS
- 专利标题(中): 在内陆地区具有绝缘层的TRENCH电容器
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申请号: US12033065申请日: 2008-02-19
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公开(公告)号: US20080135876A1公开(公告)日: 2008-06-12
- 发明人: Suk-jin Chung , Seung-hwan Lee , Sung-tae Kim , Young-sun Kim , Jae-soon Lim , Young-geun Park
- 申请人: Suk-jin Chung , Seung-hwan Lee , Sung-tae Kim , Young-sun Kim , Jae-soon Lim , Young-geun Park
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 优先权: KR10-2004-0020765 20040326
- 主分类号: H01L29/94
- IPC分类号: H01L29/94
摘要:
Trench capacitors that have insulating layer collars in undercut regions and methods of fabricating such trench capacitors are provided. Some methods of fabricating a trench capacitor include forming a first layer on a substrate. A second layer is formed on the first layer opposite to the substrate. A mask is formed that has an opening on top of the first and second layers. A first trench is formed by removing a portion of the first and second layers through the opening in the mask. A portion of the first layer under the second layer is removed to form an undercut region under the second layer. An insulating layer collar is formed in the undercut region under the second layer. A second trench is formed that extends from the first trench by removing a portion of the substrate through the opening in the mask. A buried plate is formed in the substrate along the second trench. A dielectric layer is formed on an inner wall and bottom of the second trench. A storage electrode is formed in the second trench on the dielectric layer.
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