发明申请
- 专利标题: IN-PROCESS MEASUREMENT APPARATUS
- 专利标题(中): 进程测量装置
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申请号: US13208087申请日: 2011-08-11
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公开(公告)号: US20120038385A1公开(公告)日: 2012-02-16
- 发明人: David Eaglesham , Markus Gloeckler
- 申请人: David Eaglesham , Markus Gloeckler
- 申请人地址: US OH Perrysburg
- 专利权人: FIRST SOLAR, INC
- 当前专利权人: FIRST SOLAR, INC
- 当前专利权人地址: US OH Perrysburg
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R31/28 ; H01L31/18
摘要:
An in-process measurement apparatus can be used to determine characteristics of a photovoltaic module. Capacitance measurements of the photovoltaic module are conducted before, during, or after execution of a high-potential leakage test, a performance test, or other tests of the module. The capacitance measurements are used to determine the characteristics of the photovoltaic module, including information regarding depletion width, doping density, film layer thickness, trap concentrations and absorber thickness. The apparatus can also be used to ensure that photovoltaic modules conform to product specifications.
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