PHOTOVOLTAIC DEVICE WITH A METAL SULFIDE OXIDE WINDOW LAYER
    2.
    发明申请
    PHOTOVOLTAIC DEVICE WITH A METAL SULFIDE OXIDE WINDOW LAYER 审中-公开
    具有金属硫化物窗户层的光伏器件

    公开(公告)号:US20120067422A1

    公开(公告)日:2012-03-22

    申请号:US13240101

    申请日:2011-09-22

    摘要: Methods and devices are described for a photovoltaic device and substrate structure. In one embodiment, a photovoltaic device includes a substrate structure and a MS 1-xOx window layer formed over the substrate structure, wherein M is an element from the group consisting of Zn, Sn, and In. Another embodiment is directed to a process for manufacturing a photovoltaic device including forming a MS 1-xOx window layer over a substrate by at least one of sputtering, evaporation deposition, CVD, chemical bath deposition process and vapor transport deposition process, wherein M is an element from the group consisting of Zn, Sn, and In.

    摘要翻译: 描述了用于光伏器件和衬底结构的方法和器件。 在一个实施例中,光伏器件包括衬底结构和在衬底结构上形成的MS 1-xO x窗口层,其中M是来自由Zn,Sn和In组成的组的元素。 另一个实施方案涉及一种用于制造光伏器件的方法,包括通过溅射,蒸发沉积,CVD,化学浴沉积工艺和蒸气迁移沉积工艺中的至少一种在衬底上形成MS 1-xO x窗口层,其中M为 元素由Zn,Sn和In组成。

    IN-PROCESS MEASUREMENT APPARATUS
    10.
    发明申请
    IN-PROCESS MEASUREMENT APPARATUS 审中-公开
    进程测量装置

    公开(公告)号:US20120038385A1

    公开(公告)日:2012-02-16

    申请号:US13208087

    申请日:2011-08-11

    IPC分类号: G01R31/26 G01R31/28 H01L31/18

    CPC分类号: H02S50/10 Y10T29/49004

    摘要: An in-process measurement apparatus can be used to determine characteristics of a photovoltaic module. Capacitance measurements of the photovoltaic module are conducted before, during, or after execution of a high-potential leakage test, a performance test, or other tests of the module. The capacitance measurements are used to determine the characteristics of the photovoltaic module, including information regarding depletion width, doping density, film layer thickness, trap concentrations and absorber thickness. The apparatus can also be used to ensure that photovoltaic modules conform to product specifications.

    摘要翻译: 可以使用过程测量装置来确定光伏模块的特性。 光伏组件的电容测量在高电位泄漏测试,性能测试或模块的其它测试执行之前,期间或之后进行。 电容测量用于确定光伏模块的特性,包括有关耗尽宽度,掺杂密度,膜层厚度,阱浓度和吸收体厚度的信息。 该设备还可用于确保光伏模块符合产品规格。