发明申请
- 专利标题: SENSE OPERATION FLAGS IN A MEMORY DEVICE
- 专利标题(中): 在存储器中识别操作标志
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申请号: US12942152申请日: 2010-11-09
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公开(公告)号: US20120117306A1公开(公告)日: 2012-05-10
- 发明人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
- 申请人: Shafqat Ahmed , Khaled Hasnat , Pranav Kalavade , Krishna Parat , Aaron Yip , Mark A. Helm , Andrew Bicksler
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 主分类号: G06F12/02
- IPC分类号: G06F12/02 ; G06F12/08 ; G06F12/00
摘要:
Memory devices, methods for programming sense flags, methods for sensing flags, and memory systems are disclosed. In one such memory device, the odd bit lines of a flag memory cell array are connected with a short circuit to a dynamic data cache. The even bit lines of the flag memory cell array are disconnected from the dynamic data cache. When an even page of a main memory cell array is read, the odd flag memory cells, comprising flag data, are read at the same time so that it can be determined whether the odd page of the main memory cell array has been programmed. If the flag data indicates that the odd page has not been programmed, threshold voltage windows can be adjusted to determine the states of the sensed even memory cell page.
公开/授权文献
- US09135998B2 Sense operation flags in a memory device 公开/授权日:2015-09-15
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