Invention Application
- Patent Title: PARALLEL PROGRAMMING MULTIPLE PHASE CHANGE MEMORY CELLS
- Patent Title (中): 并行编程多相变化记忆细胞
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Application No.: US13434739Application Date: 2012-03-29
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Publication No.: US20140063925A1Publication Date: 2014-03-06
- Inventor: Daniel J. Friedman , Seongwon Kim , Yong Liu , Bipin Rajendran
- Applicant: Daniel J. Friedman , Seongwon Kim , Yong Liu , Bipin Rajendran
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
Embodiments of the present invention provide a device comprising a plurality of phase change memory cells, a word line, and a plurality of bit lines. Each phase change memory cell is coupled to a corresponding transistor. Each transistor is coupled to the word line. Each bit line is coupled to a phase change memory cell of the device. The device further comprises a programming circuit configured to program at least one phase change memory cell to the SET state by selectively applying a two-stage waveform to the word line and the bit lines of the device. In a first stage, a first predetermined low voltage and a first predetermined high voltage are applied at the word line and the bit lines, respectively. In a second stage, a second predetermined high voltage and a predetermined voltage with decreasing amplitude are applied at the word line and the bit lines, respectively.
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