Invention Application
- Patent Title: COMPOSITION AND PATTERN-FORMING METHOD
- Patent Title (中): 组成和图案形成方法
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Application No.: US15064920Application Date: 2016-03-09
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Publication No.: US20160187777A1Publication Date: 2016-06-30
- Inventor: Hisashi NAKAGAWA , Ryuichi SAITO , Kenji FUJITA , Shunsuke KURITA , Tatsuya SAKAI
- Applicant: JSR CORPORATION
- Applicant Address: JP Tokyo
- Assignee: JSR CORPORATION
- Current Assignee: JSR CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2013-188750 20130911
- Main IPC: G03F7/11
- IPC: G03F7/11 ; H01L21/027 ; H01L21/3065 ; H01L21/308 ; C09D1/00 ; H01L21/311

Abstract:
A composition includes a metal compound and a solvent. The metal compound includes: a plurality of metal atoms of titanium, tantalum, zirconium, tungsten or a combination thereof; oxygen atoms each crosslinking the metal atoms; and polydentate ligands each coordinating to the metal atom. An absolute molecular weight of the metal compound as determined by static light scattering is no less than 8,000 and no greater than 50,000. A pattern-forming method includes applying the composition on an upper face side of a substrate to form an inorganic film. A resist pattern is formed on an upper face side of the inorganic film. The inorganic film and the substrate are dry-etched, by each separate etching operation, using the resist pattern as a mask such that the substrate has a pattern.
Information query
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