Invention Application
US20170017071A1 MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND RECORDING MEDIUM
审中-公开
显微系统,折射率计算方法和记录介质
- Patent Title: MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND RECORDING MEDIUM
- Patent Title (中): 显微系统,折射率计算方法和记录介质
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Application No.: US15205039Application Date: 2016-07-08
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Publication No.: US20170017071A1Publication Date: 2017-01-19
- Inventor: Yoshihiro UE , Daisuke NISHIWAKI , Kenya OKAZAKI , Osamu ONO , Shingo SUZUKI
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2015-141964 20150716
- Main IPC: G02B21/36
- IPC: G02B21/36 ; G02B21/02 ; G06T11/60 ; G01N21/41 ; G06T11/20

Abstract:
A microscopy system includes a microscope apparatus that has an objective and a correction device correcting for a spherical aberration, and a refractive index calculator that calculates a refractive index of a sample at a target position in the sample on the basis of a plurality of target set values each of which is a set value of the correction device and each of which corresponds to an amount of spherical aberration that occurs in the microscope apparatus when an observation target plane is situated at a different position in the sample in an optical-axis direction of the objective.
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