MICROSCOPE SYSTEM, OBJECTIVE LENS UNIT, AND MICROSCOPE MAIN BODY
    1.
    发明申请
    MICROSCOPE SYSTEM, OBJECTIVE LENS UNIT, AND MICROSCOPE MAIN BODY 有权
    显微镜系统,目标镜头单元和显微镜主体

    公开(公告)号:US20150022882A1

    公开(公告)日:2015-01-22

    申请号:US14329388

    申请日:2014-07-11

    CPC classification number: G02B21/06 G02B7/14 G02B21/0088 G02B21/248

    Abstract: A microscope system includes: a main body portion having an optical system for forming an image from at least observation light from a specimen; an objective lens unit having an objective lens for taking in the observation light and having a base portion with an approximately belt shape for holding the objective lens on one end; and a unit attachment portion that is held by the main body portion and is configured to detachably attach the base portion at a position where at least an optical axis of the objective lens coincides with an optical path of the observation light.

    Abstract translation: 显微镜系统包括:主体部分,具有用于至少从样本观察光形成图像的光学系统; 物镜单元,具有用于摄取观察光的物镜,具有用于将物镜保持在一端的大致带状的基部; 以及由所述主体部保持并且被构造成将所述基部可拆卸地附接到所述物镜的至少光轴与所述观察光的光路重合的位置的单元附接部。

    STAGE DEVICE
    2.
    发明申请
    STAGE DEVICE 审中-公开
    舞台设备

    公开(公告)号:US20140233097A1

    公开(公告)日:2014-08-21

    申请号:US14180787

    申请日:2014-02-14

    Inventor: Yoshihiro UE

    CPC classification number: G02B21/26

    Abstract: A stage device includes a planar base to be fixed to a microscope, a first stage that is disposed on the base and is movable in a plane parallel to a principal surface of the base, a second stage that is disposed on the base and is rotatable about an optical axis of an objective lens which is perpendicular to a movement direction of the first stage, a specimen support that is placed on the second stage and is slidable in the plane, and a first clutch mechanism that is coupled to the specimen support and the first stage and is capable of transmitting power from the first stage to the specimen support. The first clutch mechanism does not transmit power from the first stage to the specimen support when the second stage rotates, and transmits power from the first stage to the specimen support when the first stage moves.

    Abstract translation: 舞台装置包括要固定到显微镜的平面基座,设置在基座上并且可在平行于基座的主表面的平面中移动的第一平台,设置在基座上并且可旋转的第二平台 围绕与第一阶段的移动方向垂直的物镜的光轴,被放置在第二台上并且可在该平面内滑动的试样支架,以及耦合到试样支架的第一离合器机构和 第一阶段,并且能够将功率从第一阶段传输到样本支架。 当第二级旋转时,第一离合器机构不将动力从第一级传递到样品支架,并且当第一级移动时,第一离合器机构将功率从第一级传递到样本支架。

    MICROSCOPE SYSTEM AND STORAGE MEDIUM
    5.
    发明申请
    MICROSCOPE SYSTEM AND STORAGE MEDIUM 有权
    微观系统和存储介质

    公开(公告)号:US20140233094A1

    公开(公告)日:2014-08-21

    申请号:US14180189

    申请日:2014-02-13

    CPC classification number: G02B21/008 G02B21/0072

    Abstract: A microscope system includes: an objective; a correction apparatus which corrects a spherical aberration; a controller which obtains a plurality of combinations of a relative position of the objective to a sample and an optimum value, which is a set value of the correction apparatus in a state in which a spherical aberration caused in accordance with the relative position has been corrected, calculates a function expressing the relationship between the relative position and the optimum value on the basis of the obtained plurality of combinations by interpolation, and calculates the optimum value according to an observation target surface of the sample, on the basis of the function and the relative position which is determined from the observation target surface; and a correction apparatus driving apparatus which drives the correction apparatus in accordance with the optimum value, which is calculated by the controller.

    Abstract translation: 显微镜系统包括:目标; 校正球面像差的校正装置; 获取目标与样本的相对位置和最佳值的多个组合的控制器,该最佳值是在根据相对位置引起的球面像差已被校正的状态下校正装置的设定值 基于所获得的多个组合,通过插值来计算表示相对位置与最佳值之间的关系的函数,并且根据该函数和该样本计算出根据样本的观察目标表面的最佳值 从观察目标表面确定的相对位置; 以及根据由控制器计算的最佳值驱动校正装置的校正装置驱动装置。

    MICROSCOPE SYSTEM AND SETTING VALUE CALCULATION METHOD
    7.
    发明申请
    MICROSCOPE SYSTEM AND SETTING VALUE CALCULATION METHOD 审中-公开
    微观系统和设定值计算方法

    公开(公告)号:US20160170193A1

    公开(公告)日:2016-06-16

    申请号:US14964306

    申请日:2015-12-09

    Inventor: Yoshihiro UE

    Abstract: A microscope system includes a microscope apparatus and a computing device. The microscope apparatus obtains image data of a surface to be observed of a sample in each of the plurality of states having different setting values of a correction collar. The computing device calculates an evaluation value of image data on the basis of each of the plural pieces of image data. A process in which the microscope apparatus obtains the plural pieces of image data is repeated in such a way that a distribution range and an average interval of the setting values are narrowed in each repetition, and that the setting value that corresponds to a maximum evaluation value is included within the distribution range. The computing device calculates the setting value for correcting a spherical aberration on the basis of the evaluation values and the setting values that correspond to the evaluation values.

    Abstract translation: 显微镜系统包括显微镜装置和计算装置。 显微镜装置获得具有校正套环的不同设定值的多个状态中的每一个状态下的样本表面的图像数据。 计算装置基于多个图像数据中的每一个计算图像数据的评估值。 重复显微镜装置获得多个图像数据的处理,使得每个重复中的设定值的分布范围和平均间隔变窄,并且与最大评价值对应的设定值 包括在分配范围内。 计算装置根据与评价值对应的评价值和设定值,计算校正球面像差的设定值。

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