Invention Application
- Patent Title: APPARATUSES AND METHODS FOR GENERATING PROBABILISTIC INFORMATION WITH CURRENT INTEGRATION SENSING
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Application No.: US15267844Application Date: 2016-09-16
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Publication No.: US20180081753A1Publication Date: 2018-03-22
- Inventor: Patrick R. Khayat , Sivagnanam Parthasarathy , Mustafa N. Kaynak , Mark A. Helm , Aaron S. Yip
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID BOISE
- Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee: MICRON TECHNOLOGY, INC.
- Current Assignee Address: US ID BOISE
- Main IPC: G06F11/10
- IPC: G06F11/10 ; H03M13/11 ; G11C29/52 ; G06F3/06 ; G11C16/26 ; G11C16/08

Abstract:
Methods and apparatuses for generating probabilistic information for error correction using current integration are disclosed. An example method comprises sensing a first plurality of memory cells based on a first sense threshold, responsive to sensing the first plurality of cells, associating a first set of probabilistic information with the first plurality of memory cells, sensing a second plurality of memory cells based on a second sense threshold, responsive to sensing the second plurality of memory cells, associating a second set of probabilistic information with the second plurality of memory cells, and performing an error correction operation on the first and second pluralities of memory cells based, at least in part, on the first and second values.
Public/Granted literature
- US10289484B2 Apparatuses and methods for generating probabilistic information with current integration sensing Public/Granted day:2019-05-14
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