Invention Application
- Patent Title: METHODS OF READING DATA IN NONVOLATILE MEMORY DEVICES AND NONVOLATILE MEMORY DEVICES
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Application No.: US15493326Application Date: 2017-04-21
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Publication No.: US20180090216A1Publication Date: 2018-03-29
- Inventor: Wook-Ghee HAHN , Ji-Sang LEE
- Applicant: Samsung Electronics Co., Ltd.
- Priority: KR10-2016-0121862 20160923
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/26 ; G11C16/10 ; G11C16/16

Abstract:
In a method of reading data in a nonvolatile memory device including a plurality of memory cells arranged at intersections of a plurality of word-lines and a plurality of bit-lines, a read request on a first word-line of the plurality of word-lines is received, a read operation is performed on a second word-line adjacent to the first word-line and a read operation is performed on the first word-line based on data read from memory cells of the second word-line. The read operation on the first word-line is performed by adjusting a level of recover read voltage applied to the first word-line during the read operation of the first word-line based on at least one of a program state of the data read from memory cells of the second word-line and an operating parameter of the nonvolatile memory device.
Public/Granted literature
- US10056152B2 Methods of reading data in nonvolatile memory devices and nonvolatile memory devices Public/Granted day:2018-08-21
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