Invention Application
- Patent Title: SENSOR SELF-DIAGNOSTICS USING MULTIPLE SIGNAL PATHS
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Application No.: US16046093Application Date: 2018-07-26
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Publication No.: US20180328971A1Publication Date: 2018-11-15
- Inventor: Friedrich Rasbornig , Mario Motz , Dirk Hammerschmidt , Ferdinand Gastinger , Bernhard Schaffer , Wolfgang Granig
- Applicant: Infineon Technologies AG
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01D3/08 ; B60T8/88 ; G01R31/28 ; G01R31/26

Abstract:
Embodiments relate to systems and methods for sensor self-diagnostics using multiple signal paths. In an embodiment, the sensors are magnetic field sensors, and the systems and/or methods are configured to meet or exceed relevant safety or other industry standards, such as SIL standards. For example, a monolithic integrated circuit sensor system implemented on a single semiconductor ship can include a first sensor device having a first signal path for a first sensor signal on a semiconductor chip; and a second sensor device having a second signal path for a second sensor signal on the semiconductor chip, the second signal path distinct from the first signal path, wherein a comparison of the first signal path signal and the second signal path signal provides a sensor system self-test.
Public/Granted literature
- US10514410B2 Sensor self-diagnostics using multiple signal paths Public/Granted day:2019-12-24
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