- 专利标题: METHODS OF FORMING SELF ALIGNED SPACERS FOR NANOWIRE DEVICE STRUCTURES
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申请号: US15778724申请日: 2015-12-24
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公开(公告)号: US20180358436A1公开(公告)日: 2018-12-13
- 发明人: Karthik Jambunathan , Glenn Glass , Anand Murthy , Jun Sung Kang , Seiyon Kim
- 申请人: Intel Corporation
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 国际申请: PCT/US2015/000420 WO 20151224
- 主分类号: H01L29/06
- IPC分类号: H01L29/06 ; H01L29/08 ; H01L29/417 ; H01L29/66 ; H01L29/775 ; H01L29/78
摘要:
Methods of forming self-aligned nanowire spacer structures are described. An embodiment includes forming a channel structure comprising a first nanowire and a second nanowire. Source/drain structures are formed adjacent the channel structure, wherein a liner material is disposed on at least a portion of the sidewalls of the source/drain structures. A nanowire spacer structure is formed between the first and second nanowires, wherein the nanowire spacer comprises an oxidized portion of the liner.
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