Invention Application
- Patent Title: ELECTONIC TEST STRUCTRES FOR ONE OR MORE MAGNETORESISTIVE ELEMENTS, AND RELATED METHODS
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Application No.: US15949192Application Date: 2018-04-10
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Publication No.: US20190311733A1Publication Date: 2019-10-10
- Inventor: Jeff R. O'Konski , Andrew David Habermas , Charles J. Mann , Greg A. Schmitz
- Applicant: Seagate Technology LLC
- Main IPC: G11B5/455
- IPC: G11B5/455
Abstract:
The present disclosure involves electronic test structures, and related methods, for use with one or more magnetoresistive elements at least at the wafer stage of slider manufacturing.
Public/Granted literature
- US10672423B2 Electronic test structures for one or more magnetoresistive elements, and related methods Public/Granted day:2020-06-02
Information query
IPC分类:
