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1.发明授权公开(公告)号：US10672423B2
公开(公告)日：2020-06-02
申请号：US15949192
申请日：2018-04-10
Applicant: Seagate Technology LLC
Inventor： Jeff R. O'Konski , Andrew David Habermas , Charles J. Mann , Greg A. Schmitz
Abstract: The present disclosure involves electronic test structures, and related methods, for use with one or more magnetoresistive elements at least at the wafer stage of slider manufacturing.
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2.发明申请公开(公告)号：US20190311733A1
公开(公告)日：2019-10-10
申请号：US15949192
申请日：2018-04-10
Applicant: Seagate Technology LLC
Inventor： Jeff R. O'Konski , Andrew David Habermas , Charles J. Mann , Greg A. Schmitz
IPC: G11B5/455
Abstract: The present disclosure involves electronic test structures, and related methods, for use with one or more magnetoresistive elements at least at the wafer stage of slider manufacturing.
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