发明申请
- 专利标题: MEMORY READ STABILITY ENHANCEMENT WITH SHORT SEGMENTED BIT LINE ARCHITECTURE
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申请号: US16676850申请日: 2019-11-07
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公开(公告)号: US20200075092A1公开(公告)日: 2020-03-05
- 发明人: Mahmut Sinangil , Hidehiro Fujiwara , Hung-Jen Liao , Jonathan Tsung-Yung Chang , Yen-Huei Chen , Sahil Preet Singh
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 主分类号: G11C11/419
- IPC分类号: G11C11/419 ; G11C7/18 ; G11C8/16 ; G11C7/16 ; G11C11/412 ; G11C8/12
摘要:
In some embodiments, a semiconductor memory device includes an array of semiconductor memory cells arranged in rows and columns. The array includes a first segment of memory cells and a second segment of memory cells. A first pair of complementary local bit lines extend over the first segment of memory cells and is coupled to multiple memory cells along a first column within the first segment of memory cells. A second pair of complementary local bit lines extend over the second segment of memory cells and is coupled to multiple memory cells along the first column within the second segment of memory cells. A pair of switches is arranged between the first and second segments of memory cells. The pair of switches is configured to selectively couple the first pair of complementary local bit lines in series with the second pair of complementary local bit lines.
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